INTERNATIONAL PATENT: SAMSUNG ELECTRONICS CO., LTD., 삼성전자 주식회사, SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION, 서울대학교산학협력단 FILES APPLICATION FOR "METHOD FOR DIAGNOSING FAILURE IN HOME APPLIANCE AND HOME APPLIANCE"

Media coverage

• Title	INTERNATIONAL PATENT: SAMSUNG ELECTRONICS CO., LTD., 삼성전자 주식회사, SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION, 서울대학교산학협력단 FILES APPLICATION FOR "METHOD FOR DIAGNOSING FAILURE IN HOME APPLIANCE AND HOME APPLIANCE"
  Media name/outlet	US Fed News
  Country/Territory	United States
  Date	2/07/24
  Persons	Seung Yun Shin