US Patent Issued to SAMSUNG ELECTRONICS on Sept. 12 for "Inspection apparatus for inspecting semiconductor devices using charged particles" (South Korean Inventors)

Press/Media

Period	13 Sept 2023

Media coverage

Title	US Patent Issued to SAMSUNG ELECTRONICS on Sept. 12 for "Inspection apparatus for inspecting semiconductor devices using charged particles" (South Korean Inventors)
Media name/outlet	US Fed News
Country/Territory	United States
Date	13/09/23
URL	metabase.moreover.com/noarticleurl?type=psh&lni=695D-V6H1-JDKC-R3G5-00000-00
Persons	Jongmin kim