A service component model for semiconductor test equipment

Hwa Young Jeong; Yoon Ho Kim

doi:10.4028/www.scientific.net/AMM.157-158.1591

A service component model for semiconductor test equipment

Hwa Young Jeong
, Yoon Ho Kim

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Web service is a trend of new technology that it is able to support function to user over the internet. That is, user can operate and process the system, and set up values to the machine using the internet at the distance location. User doesn't have to have any database for their works in the web service environment. Therefore, the development method has changing from traditional process, it needs mechanical parts with stand-only computer and no network, to service based system with network. In this paper, we propose a service component model for semiconductor test equipment, IC test handler. This model constructs to compose the software component, business logic, as a service.

Original language	English
Title of host publication	Mechatronics and Applied Mechanics
Pages	1591-1594
Number of pages	4
DOIs	https://doi.org/10.4028/www.scientific.net/AMM.157-158.1591
Publication status	Published - 2012
Event	Mechatronics and Applied Mechanics - Hong Kong, Hong Kong Duration: 27 Dec 2011 → 28 Dec 2011

Publication series

Name	Applied Mechanics and Materials
Volume	157-158
ISSN (Print)	1660-9336
ISSN (Electronic)	1662-7482

Conference

Conference	Mechatronics and Applied Mechanics
Country/Territory	Hong Kong
City	Hong Kong
Period	27/12/11 → 28/12/11

Bibliographical note

Copyright:
Copyright 2012 Elsevier B.V., All rights reserved.

Keywords

Manufacturing system
Semiconductor test equipment
Service component
Web service

Access to Document

10.4028/www.scientific.net/AMM.157-158.1591

Cite this

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title = "A service component model for semiconductor test equipment",

abstract = "Web service is a trend of new technology that it is able to support function to user over the internet. That is, user can operate and process the system, and set up values to the machine using the internet at the distance location. User doesn't have to have any database for their works in the web service environment. Therefore, the development method has changing from traditional process, it needs mechanical parts with stand-only computer and no network, to service based system with network. In this paper, we propose a service component model for semiconductor test equipment, IC test handler. This model constructs to compose the software component, business logic, as a service.",

keywords = "Manufacturing system, Semiconductor test equipment, Service component, Web service",

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T1 - A service component model for semiconductor test equipment

AU - Jeong, Hwa Young

AU - Kim, Yoon Ho

PY - 2012

Y1 - 2012

N2 - Web service is a trend of new technology that it is able to support function to user over the internet. That is, user can operate and process the system, and set up values to the machine using the internet at the distance location. User doesn't have to have any database for their works in the web service environment. Therefore, the development method has changing from traditional process, it needs mechanical parts with stand-only computer and no network, to service based system with network. In this paper, we propose a service component model for semiconductor test equipment, IC test handler. This model constructs to compose the software component, business logic, as a service.

AB - Web service is a trend of new technology that it is able to support function to user over the internet. That is, user can operate and process the system, and set up values to the machine using the internet at the distance location. User doesn't have to have any database for their works in the web service environment. Therefore, the development method has changing from traditional process, it needs mechanical parts with stand-only computer and no network, to service based system with network. In this paper, we propose a service component model for semiconductor test equipment, IC test handler. This model constructs to compose the software component, business logic, as a service.

KW - Manufacturing system

KW - Semiconductor test equipment

KW - Service component

KW - Web service

UR - https://www.scopus.com/pages/publications/84863247554

U2 - 10.4028/www.scientific.net/AMM.157-158.1591

DO - 10.4028/www.scientific.net/AMM.157-158.1591

M3 - Conference contribution

AN - SCOPUS:84863247554

SN - 9783037853801

T3 - Applied Mechanics and Materials

SP - 1591

EP - 1594

BT - Mechatronics and Applied Mechanics

T2 - Mechatronics and Applied Mechanics

Y2 - 27 December 2011 through 28 December 2011

ER -

A service component model for semiconductor test equipment

Abstract

Publication series

Conference

Bibliographical note

Keywords

Access to Document

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Cite this