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A study on the resistive switching of La0.7Sr0.3MnO3 film using spectromicroscopy

  • Hong Sub Lee
  • , Kyung Mun Kang
  • , Woo Je Han
  • , Tae Won Lee
  • , Chang Sun Park
  • , Yong June Choi
  • , Hyung Ho Park

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Citations (Scopus)

Abstract

Resistive random access memory (ReRAM) is a promising candidate for next generation nonvolatile memory. La0. 7Sr0. 3. MnO3 (LSMO) of perovskite manganite family has a great deal of attention for ReRAM material because it makes resistive switching (RS) of interface type without a "forming process". However, the full understanding of the electronic structure and RS mechanism of LSMO remains a challenging problem. Therefore, this study performed spectromicroscopic analysis to understand the relation between the change of electronic structure and RS characteristic. The results demonstrated the electron occupation by field-induced oxygen vacancies and strong correlation effects.

Original languageEnglish
Title of host publicationAdvance Materials Development and Applied Mechanics
PublisherTrans Tech Publications Ltd
Pages184-187
Number of pages4
ISBN (Print)9783038351771
DOIs
Publication statusPublished - 2014
Event3rd International Conference on Advanced Materials Design and Mechanics, ICAMDM 2014 - , Singapore
Duration: 23 May 2014 → 24 May 2014

Publication series

NameApplied Mechanics and Materials
Volume597
ISSN (Print)1660-9336
ISSN (Electronic)1662-7482

Conference

Conference3rd International Conference on Advanced Materials Design and Mechanics, ICAMDM 2014
Country/TerritorySingapore
Period23/05/14 → 24/05/14

Keywords

  • LSMO
  • Perovskite manganite
  • ReRAM
  • Resistive switching

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