Abstract
In this paper, we demonstrate improved accuracy of the level set method for resolving deforming interfaces by proposing two key elements: (1) accurate level set solutions on adapted Cartesian grids by judiciously choosing interpolation polynomials in regions of different grid levels and (2) enhanced re-initialization by an interface sharpening procedure. The level set equation is solved using a fifth order WENO scheme or a second order central differencing scheme depending on availability of uniform stencils at each grid point. Grid adaptation criteria are determined so that the Hamiltonian functions at nodes adjacent to interfaces are always calculated by the fifth order WENO scheme. This selective usage between the fifth order WENO and second order central differencing schemes is confirmed to give more accurate results compared to those in literature for standard test problems. In order to further improve accuracy especially near thin filaments, we suggest an artificial sharpening method, which is in a similar form with the conventional re-initialization method but utilizes sign of curvature instead of sign of the level set function. Consequently, volume loss due to numerical dissipation on thin filaments is remarkably reduced for the test problems.
Original language | English |
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Pages (from-to) | 111-129 |
Number of pages | 19 |
Journal | Computers and Fluids |
Volume | 44 |
Issue number | 1 |
DOIs | |
Publication status | Published - May 2011 |
Bibliographical note
Funding Information:This research was supported by an appointment to the NASA Postdoctoral Program at the Glenn Research Center, administered by Oak Ridge Associated Universities through a contract with NASA.
Keywords
- Interface sharpening
- Interface tracking
- Level set
- Re-initialization