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Advanced spectroscopic methods for probing in-gap defect states in amorphous SiNx for charge trap memory applications
Hyun Don Kim, Minseon Gu, Kyu Myung Lee, Hanyeol Ahn, Jinwoo Byun, Gukhyon Yon, Junghyun Beak, Hyeongjoon Lim, Jaemo Jung, Jaehyeon Park, Jwa Soon Kim, Hae Joon Hahm, Soobang Kim, Won Ja Min, Moon Seop Hyun, Yun Chang Park, Gyungtae Kim, Yongsup Park, Moonsup Han, Eunjip Choi
Research output: Contribution to journal › Article › peer-review
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(Scopus)