An accurate measurement of the dipole orientation in various organic semiconductor films using photoluminescence exciton decay analysis

Ik Jang Ko, Hyuna Lee, Jin Hwan Park, Gyeong Woo Kim, Raju Lampande, Ramchandra Pode, Jang Hyuk Kwon

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

In this study, we report an accurate and more reliable approach to estimate the dipole orientation of emitters especially phosphorescence, fluorescence and even thermally activated delayed fluorescence. The dipole orientation measurements are performed by examining the variation of the photoluminescence (PL) exciton decay rate from time-resolved PL and optical analysis. Our anisotropic dipole orientation results are consistent with those of previous reports. The studied measurement approach is very reliable and accurate to estimate the dipole orientation of any organic semiconductor materials regardless of whether they are doped or neat films.

Original languageEnglish
Pages (from-to)7083-7089
Number of pages7
JournalPhysical Chemistry Chemical Physics
Volume21
Issue number13
DOIs
Publication statusPublished - 2019

Fingerprint

Dive into the research topics of 'An accurate measurement of the dipole orientation in various organic semiconductor films using photoluminescence exciton decay analysis'. Together they form a unique fingerprint.

Cite this