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An improved method for energy calibration of photon counting X-ray detectors

  • Jeong Seok Lee
  • , Ki Young Shin
  • , Dong Goo Kang
  • , Soo Yeol Lee
  • , Seung Oh Jin
  • , Insoo S. Kim
  • , Mohamed A.A. Hegazy
  • , Kisoo Kim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Photon counting X-ray detectors with energy discrimination capabilities can discriminate the energy of incident X-ray photon, thereby spectral imaging is possible with them. Energy calibration is a process to find a linear mapping function between the amplitudes of electric pulses and their corresponding photon energy. For practical and efficient energy calibration, the X-ray tube voltage can be used as a reference. However, as the exposure time increases, the threshold giving 50 % of OFF pixels also increases without converging to a point. To reduce calibration errors due to this non-convergent behavior, we present an improved method for energy calibration with applying it to two commercial photon counting X-ray detectors, i.e., a CdTe Medipix2 detector and a CdTe Pixirad2 detector with PFXIE-II read-out ASIC. With the improved mapping function estimated by the improved method, we can better identify the iodine component in a phantom consisting of iodine and other components.

Original languageEnglish
Title of host publication2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509016426
DOIs
Publication statusPublished - 16 Oct 2017
Event2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 - Strasbourg, France
Duration: 29 Oct 20166 Nov 2016

Publication series

Name2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Volume2017-January

Conference

Conference2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Country/TerritoryFrance
CityStrasbourg
Period29/10/166/11/16

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

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