Abstract
Photon counting X-ray detectors with energy discrimination capabilities can discriminate the energy of incident X-ray photon, thereby spectral imaging is possible with them. Energy calibration is a process to find a linear mapping function between the amplitudes of electric pulses and their corresponding photon energy. For practical and efficient energy calibration, the X-ray tube voltage can be used as a reference. However, as the exposure time increases, the threshold giving 50 % of OFF pixels also increases without converging to a point. To reduce calibration errors due to this non-convergent behavior, we present an improved method for energy calibration with applying it to two commercial photon counting X-ray detectors, i.e., a CdTe Medipix2 detector and a CdTe Pixirad2 detector with PFXIE-II read-out ASIC. With the improved mapping function estimated by the improved method, we can better identify the iodine component in a phantom consisting of iodine and other components.
| Original language | English |
|---|---|
| Title of host publication | 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9781509016426 |
| DOIs | |
| Publication status | Published - 16 Oct 2017 |
| Event | 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 - Strasbourg, France Duration: 29 Oct 2016 → 6 Nov 2016 |
Publication series
| Name | 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 |
|---|---|
| Volume | 2017-January |
Conference
| Conference | 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 |
|---|---|
| Country/Territory | France |
| City | Strasbourg |
| Period | 29/10/16 → 6/11/16 |
Bibliographical note
Publisher Copyright:© 2016 IEEE.
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