An In-depth Analysis of the Impact of Vacuum Conditions on the Field Emission Characteristics of a Cold Cathode C-beam

Ketan R. Bhotkar, Jaydip Sawant, Ravindra Patil, Kyu Chang Park

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The present study explores the impact of the vacuum conditions on the field emission characteristics of a cold cathode C-beam on important x-ray beam characteristics, with particular attention on the line phantom, x-ray dose rate and focal spot size. The study examines how changes in vacuum level affect the accuracy of the focal spot and the rate at which x-ray dose rate are given by delving into the dynamic link between the vacuum conditions and these crucial parameters. The goal of the research is to shed light on the complex interactions between the vacuum conditions and basic beam properties through methodical experimentation and analysis. Understanding these influences is essential for ensuring accurate and reliable diagnostic imaging outcomes while minimizing radiation exposure. The findings of this study contribute to the ongoing advancement of x-ray technology, with implications for improving health care diagnostics and patient care.

Original languageEnglish
Title of host publication2024 37th International Vacuum Nanoelectronics Conference, IVNC 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350379754
DOIs
Publication statusPublished - 2024
Event37th International Vacuum Nanoelectronics Conference, IVNC 2024 - Brno, Czech Republic
Duration: 15 Jul 202419 Jul 2024

Publication series

Name2024 37th International Vacuum Nanoelectronics Conference, IVNC 2024

Conference

Conference37th International Vacuum Nanoelectronics Conference, IVNC 2024
Country/TerritoryCzech Republic
CityBrno
Period15/07/2419/07/24

Bibliographical note

Publisher Copyright:
© 2024 IEEE.

Keywords

  • c - beam
  • field emission
  • line phantom
  • x - ray dose

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