Abstract
The present study explores the impact of the vacuum conditions on the field emission characteristics of a cold cathode C-beam on important x-ray beam characteristics, with particular attention on the line phantom, x-ray dose rate and focal spot size. The study examines how changes in vacuum level affect the accuracy of the focal spot and the rate at which x-ray dose rate are given by delving into the dynamic link between the vacuum conditions and these crucial parameters. The goal of the research is to shed light on the complex interactions between the vacuum conditions and basic beam properties through methodical experimentation and analysis. Understanding these influences is essential for ensuring accurate and reliable diagnostic imaging outcomes while minimizing radiation exposure. The findings of this study contribute to the ongoing advancement of x-ray technology, with implications for improving health care diagnostics and patient care.
Original language | English |
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Title of host publication | 2024 37th International Vacuum Nanoelectronics Conference, IVNC 2024 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9798350379754 |
DOIs | |
Publication status | Published - 2024 |
Event | 37th International Vacuum Nanoelectronics Conference, IVNC 2024 - Brno, Czech Republic Duration: 15 Jul 2024 → 19 Jul 2024 |
Publication series
Name | 2024 37th International Vacuum Nanoelectronics Conference, IVNC 2024 |
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Conference
Conference | 37th International Vacuum Nanoelectronics Conference, IVNC 2024 |
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Country/Territory | Czech Republic |
City | Brno |
Period | 15/07/24 → 19/07/24 |
Bibliographical note
Publisher Copyright:© 2024 IEEE.
Keywords
- c - beam
- field emission
- line phantom
- x - ray dose