Analysis of x-ray linear dichroism spectra for NiO thin films grown on vicinal Ag(001)

Y. Z. Wu; Y. Zhao; E. Arenholz; A. T. Young; B. Sinkovic; C. Won; Z. Q. Qiu

doi:10.1103/PhysRevB.78.064413

Analysis of x-ray linear dichroism spectra for NiO thin films grown on vicinal Ag(001)

Y. Z. Wu, Y. Zhao, E. Arenholz, A. T. Young, B. Sinkovic, C. Won, Z. Q. Qiu

Research output: Contribution to journal › Article › peer-review

29 Citations (Scopus)

Abstract

Antiferromagnetic (AFM) NiO thin films are grown epitaxially on vicinal Ag(118) substrate and investigated by x-ray linear dichroism (XLD). We find that the NiO AFM spins exhibit an in-plane spin-reorientation transition from parallel to perpendicular to the step edge direction with increasing the NiO film thickness. In addition to the conventional L2 absorption edge, XLD effect at the Ni L3 absorption edge is also measured and analyzed. The results identify a small energy shift of the L3 peak. Temperature-dependent measurement confirms that the observed XLD effect in this system at the normal incidence of the x rays originates entirely from the NiO magnetic ordering.

Original language	English
Article number	064413
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	78
Issue number	6
DOIs	https://doi.org/10.1103/PhysRevB.78.064413
Publication status	Published - 15 Aug 2008

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title = "Analysis of x-ray linear dichroism spectra for NiO thin films grown on vicinal Ag(001)",

abstract = "Antiferromagnetic (AFM) NiO thin films are grown epitaxially on vicinal Ag(118) substrate and investigated by x-ray linear dichroism (XLD). We find that the NiO AFM spins exhibit an in-plane spin-reorientation transition from parallel to perpendicular to the step edge direction with increasing the NiO film thickness. In addition to the conventional L2 absorption edge, XLD effect at the Ni L3 absorption edge is also measured and analyzed. The results identify a small energy shift of the L3 peak. Temperature-dependent measurement confirms that the observed XLD effect in this system at the normal incidence of the x rays originates entirely from the NiO magnetic ordering.",

author = "Wu, {Y. Z.} and Y. Zhao and E. Arenholz and Young, {A. T.} and B. Sinkovic and C. Won and Qiu, {Z. Q.}",

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T1 - Analysis of x-ray linear dichroism spectra for NiO thin films grown on vicinal Ag(001)

AU - Wu, Y. Z.

AU - Zhao, Y.

AU - Arenholz, E.

AU - Young, A. T.

AU - Sinkovic, B.

AU - Won, C.

AU - Qiu, Z. Q.

PY - 2008/8/15

Y1 - 2008/8/15

N2 - Antiferromagnetic (AFM) NiO thin films are grown epitaxially on vicinal Ag(118) substrate and investigated by x-ray linear dichroism (XLD). We find that the NiO AFM spins exhibit an in-plane spin-reorientation transition from parallel to perpendicular to the step edge direction with increasing the NiO film thickness. In addition to the conventional L2 absorption edge, XLD effect at the Ni L3 absorption edge is also measured and analyzed. The results identify a small energy shift of the L3 peak. Temperature-dependent measurement confirms that the observed XLD effect in this system at the normal incidence of the x rays originates entirely from the NiO magnetic ordering.

AB - Antiferromagnetic (AFM) NiO thin films are grown epitaxially on vicinal Ag(118) substrate and investigated by x-ray linear dichroism (XLD). We find that the NiO AFM spins exhibit an in-plane spin-reorientation transition from parallel to perpendicular to the step edge direction with increasing the NiO film thickness. In addition to the conventional L2 absorption edge, XLD effect at the Ni L3 absorption edge is also measured and analyzed. The results identify a small energy shift of the L3 peak. Temperature-dependent measurement confirms that the observed XLD effect in this system at the normal incidence of the x rays originates entirely from the NiO magnetic ordering.

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JO - Physical Review B - Condensed Matter and Materials Physics

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Analysis of x-ray linear dichroism spectra for NiO thin films grown on vicinal Ag(001)

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