Antiferromagnetic spin reorientation transition in epitaxial NiO/CoO/MgO(001) systems

J. Zhu; Q. Li; J. X. Li; Z. Ding; J. H. Liang; X. Xiao; Y. M. Luo; C. Y. Hua; H. J. Lin; T. W. Pi; Z. Hu; C. Won; Y. Z. Wu

doi:10.1103/PhysRevB.90.054403

Antiferromagnetic spin reorientation transition in epitaxial NiO/CoO/MgO(001) systems

J. Zhu, Q. Li, J. X. Li, Z. Ding, J. H. Liang, X. Xiao, Y. M. Luo, C. Y. Hua, H. J. Lin, T. W. Pi, Z. Hu, C. Won, Y. Z. Wu

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29 Citations (Scopus)

Abstract

The magnetic properties of antiferromagnetic (AFM) spins were investigated using x-ray magnetic linear dichroism (XMLD) in epitaxial NiO/CoO/MgO(001) films as a function of film thickness, temperature, and interface modulation. We found that the NiO AFM spins undergo a spin reorientation transition (SRT) from the in-plane orientation to the out-of-plane orientation at a critical NiO thickness. The NiO AFM SRT can be attributed to the competition between the out-of-plane anisotropy of the NiO AFM spins and the AFM interfacial exchange coupling with the CoO in-plane spins. The NiO SRT thickness increases with the CoO thickness and also with the interfacial coupling strength. The temperature-dependent XMLD measurement indicates that the exchange coupling at the NiO/CoO interface can greatly enhance the Néel temperature of the CoO layer.

Original language	English
Article number	054403
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	90
Issue number	5
DOIs	https://doi.org/10.1103/PhysRevB.90.054403
Publication status	Published - 6 Aug 2014

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title = "Antiferromagnetic spin reorientation transition in epitaxial NiO/CoO/MgO(001) systems",

abstract = "The magnetic properties of antiferromagnetic (AFM) spins were investigated using x-ray magnetic linear dichroism (XMLD) in epitaxial NiO/CoO/MgO(001) films as a function of film thickness, temperature, and interface modulation. We found that the NiO AFM spins undergo a spin reorientation transition (SRT) from the in-plane orientation to the out-of-plane orientation at a critical NiO thickness. The NiO AFM SRT can be attributed to the competition between the out-of-plane anisotropy of the NiO AFM spins and the AFM interfacial exchange coupling with the CoO in-plane spins. The NiO SRT thickness increases with the CoO thickness and also with the interfacial coupling strength. The temperature-dependent XMLD measurement indicates that the exchange coupling at the NiO/CoO interface can greatly enhance the N{\'e}el temperature of the CoO layer.",

author = "J. Zhu and Q. Li and Li, {J. X.} and Z. Ding and Liang, {J. H.} and X. Xiao and Luo, {Y. M.} and Hua, {C. Y.} and Lin, {H. J.} and Pi, {T. W.} and Z. Hu and C. Won and Wu, {Y. Z.}",

year = "2014",

month = aug,

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doi = "10.1103/PhysRevB.90.054403",

language = "English",

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T1 - Antiferromagnetic spin reorientation transition in epitaxial NiO/CoO/MgO(001) systems

AU - Zhu, J.

AU - Li, Q.

AU - Li, J. X.

AU - Ding, Z.

AU - Liang, J. H.

AU - Xiao, X.

AU - Luo, Y. M.

AU - Hua, C. Y.

AU - Lin, H. J.

AU - Pi, T. W.

AU - Hu, Z.

AU - Won, C.

AU - Wu, Y. Z.

PY - 2014/8/6

Y1 - 2014/8/6

N2 - The magnetic properties of antiferromagnetic (AFM) spins were investigated using x-ray magnetic linear dichroism (XMLD) in epitaxial NiO/CoO/MgO(001) films as a function of film thickness, temperature, and interface modulation. We found that the NiO AFM spins undergo a spin reorientation transition (SRT) from the in-plane orientation to the out-of-plane orientation at a critical NiO thickness. The NiO AFM SRT can be attributed to the competition between the out-of-plane anisotropy of the NiO AFM spins and the AFM interfacial exchange coupling with the CoO in-plane spins. The NiO SRT thickness increases with the CoO thickness and also with the interfacial coupling strength. The temperature-dependent XMLD measurement indicates that the exchange coupling at the NiO/CoO interface can greatly enhance the Néel temperature of the CoO layer.

AB - The magnetic properties of antiferromagnetic (AFM) spins were investigated using x-ray magnetic linear dichroism (XMLD) in epitaxial NiO/CoO/MgO(001) films as a function of film thickness, temperature, and interface modulation. We found that the NiO AFM spins undergo a spin reorientation transition (SRT) from the in-plane orientation to the out-of-plane orientation at a critical NiO thickness. The NiO AFM SRT can be attributed to the competition between the out-of-plane anisotropy of the NiO AFM spins and the AFM interfacial exchange coupling with the CoO in-plane spins. The NiO SRT thickness increases with the CoO thickness and also with the interfacial coupling strength. The temperature-dependent XMLD measurement indicates that the exchange coupling at the NiO/CoO interface can greatly enhance the Néel temperature of the CoO layer.

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DO - 10.1103/PhysRevB.90.054403

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JO - Physical Review B - Condensed Matter and Materials Physics

JF - Physical Review B - Condensed Matter and Materials Physics

IS - 5

M1 - 054403

ER -

Antiferromagnetic spin reorientation transition in epitaxial NiO/CoO/MgO(001) systems

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