Cathodoluminescence properties of silicon thin films with carbon nanotube electron beam (C-beam) exposure technique

Won Jong Kim; Jung Su Kang; Ha Rim Lee; Ji Hwan Hong; Hee Tae Park; Kyu Chang Park

Cathodoluminescence properties of silicon thin films with carbon nanotube electron beam (C-beam) exposure technique

Won Jong Kim, Jung Su Kang, Ha Rim Lee, Ji Hwan Hong, Hee Tae Park, Kyu Chang Park

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In this study, we investigated the cathodoluminescence (CL) properties of silicon thin films with carbon nanotube electron beam (C-beam) exposure technique. An intensive CL emission spectrum is observed in the visible range of 300-800 nm and also we compared the CL properties with varying the thickness of silicon thin films.

Original language	English
Title of host publication	21st International Display Workshops 2014, IDW 2014
Publisher	Society for Information Display
Pages	1239-1242
Number of pages	4
ISBN (Electronic)	9781510827790
Publication status	Published - 2014
Event	21st International Display Workshops 2014, IDW 2014 - Niigata, Japan Duration: 3 Dec 2014 → 5 Dec 2014

Publication series

Name	21st International Display Workshops 2014, IDW 2014
Volume	2

Conference

Conference	21st International Display Workshops 2014, IDW 2014
Country/Territory	Japan
City	Niigata
Period	3/12/14 → 5/12/14

Bibliographical note

Publisher Copyright:
© 2014 . Society for Information Display. All rights reserved.

Keywords

C-beam
CL
CNT emitters
Field emission

Cite this

Kim, W. J., Kang, J. S., Lee, H. R., Hong, J. H., Park, H. T., & Park, K. C. (2014). Cathodoluminescence properties of silicon thin films with carbon nanotube electron beam (C-beam) exposure technique. In 21st International Display Workshops 2014, IDW 2014 (pp. 1239-1242). (21st International Display Workshops 2014, IDW 2014; Vol. 2). Society for Information Display.

@inproceedings{412e4b78033944609c77ee61b9fce7a0,

title = "Cathodoluminescence properties of silicon thin films with carbon nanotube electron beam (C-beam) exposure technique",

abstract = "In this study, we investigated the cathodoluminescence (CL) properties of silicon thin films with carbon nanotube electron beam (C-beam) exposure technique. An intensive CL emission spectrum is observed in the visible range of 300-800 nm and also we compared the CL properties with varying the thickness of silicon thin films.",

keywords = "C-beam, CL, CNT emitters, Field emission",

author = "Kim, {Won Jong} and Kang, {Jung Su} and Lee, {Ha Rim} and Hong, {Ji Hwan} and Park, {Hee Tae} and Park, {Kyu Chang}",

note = "Publisher Copyright: {\textcopyright} 2014 . Society for Information Display. All rights reserved.; 21st International Display Workshops 2014, IDW 2014 ; Conference date: 03-12-2014 Through 05-12-2014",

year = "2014",

language = "English",

series = "21st International Display Workshops 2014, IDW 2014",

publisher = "Society for Information Display",

pages = "1239--1242",

booktitle = "21st International Display Workshops 2014, IDW 2014",

}

Kim, WJ, Kang, JS, Lee, HR, Hong, JH, Park, HT & Park, KC 2014, Cathodoluminescence properties of silicon thin films with carbon nanotube electron beam (C-beam) exposure technique. in 21st International Display Workshops 2014, IDW 2014. 21st International Display Workshops 2014, IDW 2014, vol. 2, Society for Information Display, pp. 1239-1242, 21st International Display Workshops 2014, IDW 2014, Niigata, Japan, 3/12/14.

Cathodoluminescence properties of silicon thin films with carbon nanotube electron beam (C-beam) exposure technique. / Kim, Won Jong; Kang, Jung Su; Lee, Ha Rim et al.
21st International Display Workshops 2014, IDW 2014. Society for Information Display, 2014. p. 1239-1242 (21st International Display Workshops 2014, IDW 2014; Vol. 2).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Cathodoluminescence properties of silicon thin films with carbon nanotube electron beam (C-beam) exposure technique

AU - Kim, Won Jong

AU - Kang, Jung Su

AU - Lee, Ha Rim

AU - Hong, Ji Hwan

AU - Park, Hee Tae

AU - Park, Kyu Chang

PY - 2014

Y1 - 2014

N2 - In this study, we investigated the cathodoluminescence (CL) properties of silicon thin films with carbon nanotube electron beam (C-beam) exposure technique. An intensive CL emission spectrum is observed in the visible range of 300-800 nm and also we compared the CL properties with varying the thickness of silicon thin films.

AB - In this study, we investigated the cathodoluminescence (CL) properties of silicon thin films with carbon nanotube electron beam (C-beam) exposure technique. An intensive CL emission spectrum is observed in the visible range of 300-800 nm and also we compared the CL properties with varying the thickness of silicon thin films.

KW - C-beam

KW - CL

KW - CNT emitters

KW - Field emission

UR - http://www.scopus.com/inward/record.url?scp=85050567406&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:85050567406

T3 - 21st International Display Workshops 2014, IDW 2014

SP - 1239

EP - 1242

BT - 21st International Display Workshops 2014, IDW 2014

PB - Society for Information Display

T2 - 21st International Display Workshops 2014, IDW 2014

Y2 - 3 December 2014 through 5 December 2014

ER -

Cathodoluminescence properties of silicon thin films with carbon nanotube electron beam (C-beam) exposure technique

Abstract

Publication series

Conference

Bibliographical note

Keywords

Other files and links

Fingerprint

Cite this