Comparative analysis on negative-bias-illumination-stress instabilities between planar- and vertical-channel thin-film transistors using InGaZnO active channels prepared by atomic-layer deposition

Ji Won Kang, Dong Hee Lee, Young Ha Kwon, Nak Jin Seong, Kyu Jeong Choi, Chi Sun Hwang, Sung Min Yoon

Research output: Contribution to journal › Article › peer-review

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