Comparison of electron emission properties of silicon coated carbon nanotubes in O2 atmosphere

Woo Mi Bae, Su Woong Lee, An Na Ha, Eun Hye Lee, Hee Chul Woo, Young Ju Eom, Jang Jin, Kyu Chang Park

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We studied the electron emission of silicon coated CNT with various O 2 partial pressure. The electron emission currrent shows differen reduction rate with growth condition and gas pressure. However, a degradation rate of electron emission current of silicon coated CNTs show deareases compared with conventional CNTs. Enhanced life time with reduced degradation rate with silicon coated CNTs appear to silicon protection layer on CNTs.

Original languageEnglish
Title of host publicationProceedings - IVNC 2011
Subtitle of host publication2011 24th International Vacuum Nanoelectronics Conference
Pages131-132
Number of pages2
Publication statusPublished - 2011
Event2011 24th International Vacuum Nanoelectronics Conference, IVNC 2011 - Wuppertal, Germany
Duration: 18 Jul 201122 Jul 2011

Publication series

NameProceedings - IVNC 2011: 2011 24th International Vacuum Nanoelectronics Conference

Conference

Conference2011 24th International Vacuum Nanoelectronics Conference, IVNC 2011
Country/TerritoryGermany
CityWuppertal
Period18/07/1122/07/11

Keywords

  • Carbon nanotube
  • Field emission
  • O ambient
  • RAP(resist-assisted patterning)

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