Compositional ratio effects on the device stability of IGZO TFTs

Shinhyuk Yang; Jun Yong Bak; Sung Min Yoon; Min Ki Ryu; Him Chan Oh; Chi Sun Hwang; Sang Hee Ko Park; Jin Jang

Compositional ratio effects on the device stability of IGZO TFTs

Shinhyuk Yang, Jun Yong Bak, Sung Min Yoon, Min Ki Ryu, Him Chan Oh, Chi Sun Hwang, Sang Hee Ko Park, Jin Jang

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We fabricated transparent In-Ga-Zn-O TFTs with topgate structure on glass substrate. The IGZO semiconductors with various compositional ratios were used to compare that effect on bias stability and photon-induced negative bias instability. We found that deep level state in IGZO semiconductors highly affected by In/Ga ratio.

Original language	English
Title of host publication	31st International Display Research Conference 2011, EuroDisplay 2011
Pages	206-208
Number of pages	3
Publication status	Published - 2011
Event	31st International Display Research Conference 2011, EuroDisplay 2011 - Arcachon, France Duration: 19 Sept 2011 → 22 Sept 2011

Publication series

Name	SID Conference Record of the International Display Research Conference
ISSN (Print)	1083-1312

Conference

Conference	31st International Display Research Conference 2011, EuroDisplay 2011
Country/Territory	France
City	Arcachon
Period	19/09/11 → 22/09/11

Cite this

@inproceedings{c729c75966e84128a7b1428dda14cf5b,

title = "Compositional ratio effects on the device stability of IGZO TFTs",

abstract = "We fabricated transparent In-Ga-Zn-O TFTs with topgate structure on glass substrate. The IGZO semiconductors with various compositional ratios were used to compare that effect on bias stability and photon-induced negative bias instability. We found that deep level state in IGZO semiconductors highly affected by In/Ga ratio.",

author = "Shinhyuk Yang and Bak, {Jun Yong} and Yoon, {Sung Min} and Ryu, {Min Ki} and Oh, {Him Chan} and Hwang, {Chi Sun} and Park, {Sang Hee Ko} and Jin Jang",

year = "2011",

language = "English",

isbn = "9781618396006",

series = "SID Conference Record of the International Display Research Conference",

pages = "206--208",

booktitle = "31st International Display Research Conference 2011, EuroDisplay 2011",

}

Yang, S, Bak, JY, Yoon, SM, Ryu, MK, Oh, HC, Hwang, CS, Park, SHK & Jang, J 2011, Compositional ratio effects on the device stability of IGZO TFTs. in 31st International Display Research Conference 2011, EuroDisplay 2011. SID Conference Record of the International Display Research Conference, pp. 206-208, 31st International Display Research Conference 2011, EuroDisplay 2011, Arcachon, France, 19/09/11.

Compositional ratio effects on the device stability of IGZO TFTs. / Yang, Shinhyuk; Bak, Jun Yong; Yoon, Sung Min et al.
31st International Display Research Conference 2011, EuroDisplay 2011. 2011. p. 206-208 (SID Conference Record of the International Display Research Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Compositional ratio effects on the device stability of IGZO TFTs

AU - Yang, Shinhyuk

AU - Bak, Jun Yong

AU - Yoon, Sung Min

AU - Ryu, Min Ki

AU - Oh, Him Chan

AU - Hwang, Chi Sun

AU - Park, Sang Hee Ko

AU - Jang, Jin

PY - 2011

Y1 - 2011

N2 - We fabricated transparent In-Ga-Zn-O TFTs with topgate structure on glass substrate. The IGZO semiconductors with various compositional ratios were used to compare that effect on bias stability and photon-induced negative bias instability. We found that deep level state in IGZO semiconductors highly affected by In/Ga ratio.

AB - We fabricated transparent In-Ga-Zn-O TFTs with topgate structure on glass substrate. The IGZO semiconductors with various compositional ratios were used to compare that effect on bias stability and photon-induced negative bias instability. We found that deep level state in IGZO semiconductors highly affected by In/Ga ratio.

UR - http://www.scopus.com/inward/record.url?scp=84860851936&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84860851936

SN - 9781618396006

T3 - SID Conference Record of the International Display Research Conference

SP - 206

EP - 208

BT - 31st International Display Research Conference 2011, EuroDisplay 2011

T2 - 31st International Display Research Conference 2011, EuroDisplay 2011

Y2 - 19 September 2011 through 22 September 2011

ER -

Compositional ratio effects on the device stability of IGZO TFTs

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