Abstract
We demonstrate the degradation analysis of red indium phosphide (InP) quantum dot light-emitting diodes (QLEDs) by measuring the stability of each layer. Our analysis shows that InP-QDs are very unstable against electron-exciton stress and we anticipate that this is the cause of the degradation of QLED.
| Original language | English |
|---|---|
| Pages (from-to) | 72-73 |
| Number of pages | 2 |
| Journal | Digest of Technical Papers - SID International Symposium |
| Volume | 53 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2022 |
| Event | 59th International Symposium, Seminar and Exhibition, Display Week 2022 - San Jose, United States Duration: 8 May 2022 → 13 May 2022 |
Bibliographical note
Publisher Copyright:© 2022 SID.
Keywords
- Degradation
- Hole and electron stress
- Quantum-dots