Abstract
The relationship between the density of electron emitters and x-ray image quality has been investigated. Under diode mode, x-ray images have been successfully acquired even under 30kV of bias. Vertically aligned CNT emitters were grown as electron emitters. With respect to the inter-emitter pitch, even at the same electrical energy, different emitter patterns showed different image qualities. By optimizing the CNT emitter design, we expect that we can develop a high-resolution x-ray source without using additional focusing components.
Original language | English |
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Title of host publication | 26th International Display Workshops, IDW 2019 |
Publisher | International Display Workshops |
Pages | 1437-1439 |
Number of pages | 3 |
ISBN (Electronic) | 9781713806301 |
Publication status | Published - 2019 |
Event | 26th International Display Workshops, IDW 2019 - Sapporo, Japan Duration: 27 Nov 2019 → 29 Nov 2019 |
Publication series
Name | Proceedings of the International Display Workshops |
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Volume | 3 |
ISSN (Print) | 1883-2490 |
Conference
Conference | 26th International Display Workshops, IDW 2019 |
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Country/Territory | Japan |
City | Sapporo |
Period | 27/11/19 → 29/11/19 |
Bibliographical note
Publisher Copyright:© 2019 ITE and SID
Keywords
- Cold cathode emitters
- Field emission
- X-ray resolution
- X-ray VRXUFH