Skip to main navigation Skip to search Skip to main content

Dielectric Function and Critical Points of SnS0.52Se0.48 in the Temperature Range from 27 to 350 K

  • Tae Jung Kim
  • , Xuan Au Nguyen
  • , Bogyu Kim
  • , Kyujin Kim
  • , Wonjun Lee
  • , Young Dong Kim
  • , Van Long Le
  • , Hoang Tung Nguyen

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

We report the dielectric function ε = ε1 + iε2 and the critical point (CP) energies of the orthorhombic SnS0.52Se0.48 alloy for the zigzag (a)and thearmchair(6) directions in the spectral energy range from 0.74 to 6.42 eV and the temperature range from 27 to 350 K using spectroscopic ellipsometry. The CP energies were determined from the 2nd derivative spectra by using the standard analytic method. We observed sharpenings and blue-shifts of the CPs with decreasing temperature. We found thirteen and twelve CPs for the a-and the b-directions, respectively, at the lowest temperature while only eight and nine CPs were detected at room temperature. Also, an exciton effect was observed only in the armchair direction at low temperatures. The temperature dependences of the CP energies were determined by fitting the data to a phenomenological expression that contain the Bose-Einstein statistical factor and the temperature coefficient to describe the electron-phonon interaction.

Original languageEnglish
Pages (from-to)981-986
Number of pages6
JournalJournal of the Korean Physical Society
Volume77
Issue number11
DOIs
Publication statusPublished - Dec 2020

Bibliographical note

Publisher Copyright:
© 2020, The Korean Physical Society.

Keywords

  • Bulk SnSSe
  • Critical point
  • Dielectric function
  • Spectroscopic ellipsometry

Fingerprint

Dive into the research topics of 'Dielectric Function and Critical Points of SnS0.52Se0.48 in the Temperature Range from 27 to 350 K'. Together they form a unique fingerprint.

Cite this