Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters

S. G. Choi; D. E. Aspnes; N. A. Stoute; Y. D. Kim; H. J. Kim; Y. C. Chang; C. J. Palmstrøm

doi:10.1002/pssa.200777848

Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters

S. G. Choi, D. E. Aspnes, N. A. Stoute, Y. D. Kim, H. J. Kim, Y. C. Chang, C. J. Palmstrøm

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

Spectroscopic ellipsometry is used to determine pseudodielectric function spectra 〈ε〉 = 〈ε ₁〈+i〈ε ₂〈 of InAs _xP _I-x al-loy thin films from 1.5 to 6.0 eV at room temperature. The structures for the E ₁, E ₁ + Δ ₁, E′ ₀, and E′ ₂ critical points (CPs) were observed in the data. We compare direct- and reciprocal-space methods of extracting CP energies E _g. The direct-space values show less uncertainty, a result of how the two procedures use available information. Energies obtained are compared with the results of theoretical calculations using the linear augmented Slater-type orbital (LASTO) method.

Original language	English
Pages (from-to)	884-887
Number of pages	4
Journal	Physica Status Solidi (A) Applications and Materials Science
Volume	205
Issue number	4
DOIs	https://doi.org/10.1002/pssa.200777848
Publication status	Published - Apr 2008

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Choi, S. G., Aspnes, D. E., Stoute, N. A., Kim, Y. D., Kim, H. J., Chang, Y. C., & Palmstrøm, C. J. (2008). Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters. Physica Status Solidi (A) Applications and Materials Science, 205(4), 884-887. https://doi.org/10.1002/pssa.200777848

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abstract = "Spectroscopic ellipsometry is used to determine pseudodielectric function spectra 〈ε〉 = 〈ε 1〈+i〈ε 2〈 of InAs xP I-x al-loy thin films from 1.5 to 6.0 eV at room temperature. The structures for the E 1, E 1 + Δ 1, E′ 0, and E′ 2 critical points (CPs) were observed in the data. We compare direct- and reciprocal-space methods of extracting CP energies E g. The direct-space values show less uncertainty, a result of how the two procedures use available information. Energies obtained are compared with the results of theoretical calculations using the linear augmented Slater-type orbital (LASTO) method.",

author = "Choi, {S. G.} and Aspnes, {D. E.} and Stoute, {N. A.} and Kim, {Y. D.} and Kim, {H. J.} and Chang, {Y. C.} and Palmstr{\o}m, {C. J.}",

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AU - Choi, S. G.

AU - Aspnes, D. E.

AU - Stoute, N. A.

AU - Kim, Y. D.

AU - Kim, H. J.

AU - Chang, Y. C.

AU - Palmstrøm, C. J.

PY - 2008/4

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N2 - Spectroscopic ellipsometry is used to determine pseudodielectric function spectra 〈ε〉 = 〈ε 1〈+i〈ε 2〈 of InAs xP I-x al-loy thin films from 1.5 to 6.0 eV at room temperature. The structures for the E 1, E 1 + Δ 1, E′ 0, and E′ 2 critical points (CPs) were observed in the data. We compare direct- and reciprocal-space methods of extracting CP energies E g. The direct-space values show less uncertainty, a result of how the two procedures use available information. Energies obtained are compared with the results of theoretical calculations using the linear augmented Slater-type orbital (LASTO) method.

AB - Spectroscopic ellipsometry is used to determine pseudodielectric function spectra 〈ε〉 = 〈ε 1〈+i〈ε 2〈 of InAs xP I-x al-loy thin films from 1.5 to 6.0 eV at room temperature. The structures for the E 1, E 1 + Δ 1, E′ 0, and E′ 2 critical points (CPs) were observed in the data. We compare direct- and reciprocal-space methods of extracting CP energies E g. The direct-space values show less uncertainty, a result of how the two procedures use available information. Energies obtained are compared with the results of theoretical calculations using the linear augmented Slater-type orbital (LASTO) method.

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Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters

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