Abstract
Quantum well states (QWS's) in Cu thin films grown on Co/Cu(001) were studied using angle-resolved photoemission spectroscopy. For the normal photoemission, QWS's from both lower and higher energy bands relative to the vacuum level were measured, and explained by phase accumulation method. QWS's from the lower band were studied in detail as a function of the in-plane momentum k∥. We found that the QWS dispersion depends on the Cu film thickness. From the experimental data, we deduced the quantized perpendicular momentum k⊥ and the energy as a function of k∥. Our results show that the in-plane effective mass cannot be obtained by a simple parabolic fitting of the E vs k∥ due to the dependence of k⊥ on k∥.
Original language | English |
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Article number | 245418 |
Pages (from-to) | 2454181-2454185 |
Number of pages | 5 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 66 |
Issue number | 24 |
Publication status | Published - 15 Dec 2002 |