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Dissociative photoionization of bis(Dimethyl-µ-isopropylamido-aluminum) and bis(dimethyl-µ-t-butylamido-aluminum) in the region hv=65-133 ev by mass spectrometry

  • Seung Min Park
  • , Bong Hyun Boo
  • , Yoonsoo Kim
  • , Joon T. Park
  • , Inosuke Koyano

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

The dissociative photoionization studies of bis(dimethyl-µ-isopropylamido-aluminum) and bis(dimethyl-µ-t-butylamido-aluminum) in the photon energy range of 67-133 eV have been performed as preliminary studies of synchrotron radiation single-precursor chemical vapor deposition. Photoelectron-photoion coincidence and photoion-photoion coincidence mass spectra are analyzed to understand the effects of A1:2 p and A1:2 s core excitation on the branching ratios of photofragments produced by absorption of synchrotron radiation.

Original languageEnglish
Pages (from-to)L933-L936
JournalJapanese Journal of Applied Physics
Volume34
Issue number7
DOIs
Publication statusPublished - Jul 1995

Keywords

  • Aluminum nitride thin film
  • Dissociative photoionizaiion
  • Organometallic chemical vapor deposition
  • Single precursor
  • Synchrotron radiation

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