Abstract
The dissociative photoionization studies of bis(dimethyl-µ-isopropylamido-aluminum) and bis(dimethyl-µ-t-butylamido-aluminum) in the photon energy range of 67-133 eV have been performed as preliminary studies of synchrotron radiation single-precursor chemical vapor deposition. Photoelectron-photoion coincidence and photoion-photoion coincidence mass spectra are analyzed to understand the effects of A1:2 p and A1:2 s core excitation on the branching ratios of photofragments produced by absorption of synchrotron radiation.
| Original language | English |
|---|---|
| Pages (from-to) | L933-L936 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 34 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - Jul 1995 |
Keywords
- Aluminum nitride thin film
- Dissociative photoionizaiion
- Organometallic chemical vapor deposition
- Single precursor
- Synchrotron radiation
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