Effect of AC and DC gate bias-stress on the performance of a-IGZO TFTs on plastic substrate

Mallory Mativegna; Min Hyuk Choi; Jae Won Choi; Jin Jang

Effect of AC and DC gate bias-stress on the performance of a-IGZO TFTs on plastic substrate

Mallory Mativegna, Min Hyuk Choi, Jae Won Choi, Jin Jang

Research output: Contribution to conference › Paper › peer-review

Abstract

The effect of AC and DC gate bias stress is investigated in a-IGZO TFTs on polyimide. For the same effective stress time, AC induces a smaller positive ΔV_th compared to DC Stress, indicating trapping as the main degradation mechanism. The time dependence of ΔVth thus follows the stretched exponential equation.

Original language	English
Pages	455-458
Number of pages	4
Publication status	Published - 2010
Event	17th International Display Workshops, IDW'10 - Fukuoka, Japan Duration: 1 Dec 2010 → 3 Dec 2010

Conference

Conference	17th International Display Workshops, IDW'10
Country/Territory	Japan
City	Fukuoka
Period	1/12/10 → 3/12/10

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title = "Effect of AC and DC gate bias-stress on the performance of a-IGZO TFTs on plastic substrate",

abstract = "The effect of AC and DC gate bias stress is investigated in a-IGZO TFTs on polyimide. For the same effective stress time, AC induces a smaller positive ΔVth compared to DC Stress, indicating trapping as the main degradation mechanism. The time dependence of ΔVth thus follows the stretched exponential equation.",

author = "Mallory Mativegna and Choi, {Min Hyuk} and Choi, {Jae Won} and Jin Jang",

year = "2010",

language = "English",

pages = "455--458",

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TY - CONF

T1 - Effect of AC and DC gate bias-stress on the performance of a-IGZO TFTs on plastic substrate

AU - Mativegna, Mallory

AU - Choi, Min Hyuk

AU - Choi, Jae Won

AU - Jang, Jin

PY - 2010

Y1 - 2010

N2 - The effect of AC and DC gate bias stress is investigated in a-IGZO TFTs on polyimide. For the same effective stress time, AC induces a smaller positive ΔVth compared to DC Stress, indicating trapping as the main degradation mechanism. The time dependence of ΔVth thus follows the stretched exponential equation.

AB - The effect of AC and DC gate bias stress is investigated in a-IGZO TFTs on polyimide. For the same effective stress time, AC induces a smaller positive ΔVth compared to DC Stress, indicating trapping as the main degradation mechanism. The time dependence of ΔVth thus follows the stretched exponential equation.

UR - http://www.scopus.com/inward/record.url?scp=79956328441&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:79956328441

SP - 455

EP - 458

T2 - 17th International Display Workshops, IDW'10

Y2 - 1 December 2010 through 3 December 2010

ER -

Effect of AC and DC gate bias-stress on the performance of a-IGZO TFTs on plastic substrate

Abstract

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