Effect of Electrical Aging of Cold Cathode C-Beam on Focal Spot Size and X-Ray Dose

Ketan Bhotkar; Yi Yin Yu; Bishwa Chandra Adhikari; Kyu Chang Park

doi:10.1109/IVNC57695.2023.10189016

Effect of Electrical Aging of Cold Cathode C-Beam on Focal Spot Size and X-Ray Dose

Ketan Bhotkar, Yi Yin Yu, Bishwa Chandra Adhikari, Kyu Chang Park

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The purpose of this study was to evaluate the effect of electrical aging on the cold cathode electron beam (C-beam). This experiment is performed by the vertically aligned carbon nanotube in which it is established that the applied bias for efficient electrical aging and defined the bias voltage as the voltage at which joule heating occurred. A long-term stable field electron emission from carbon nanotube arrays can be achieved through an aging process at high emission current. Additionally, x-ray imaging and dose measurement were used to assess the Focal Spot Size (FSS) of the tungsten cross wire used as a standard resolution testing object (EN 12543-5). We found that the aging had no significant effect on the FSS, but the x-ray dose rate enhanced from 0.45 mGy/sec to 1.1 mGy/sec.

Original language	English
Title of host publication	36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	233-234
Number of pages	2
ISBN (Electronic)	9798350301434
DOIs	https://doi.org/10.1109/IVNC57695.2023.10189016
Publication status	Published - 2023
Event	36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023 - Cambridge, United States Duration: 10 Jul 2023 → 13 Jul 2023

Publication series

Name	36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023

Conference

Conference	36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023
Country/Territory	United States
City	Cambridge
Period	10/07/23 → 13/07/23

Bibliographical note

Publisher Copyright:
© 2023 IEEE.

Keywords

Electrical aging
carbon nanotubes
joule heating

Access to Document

10.1109/IVNC57695.2023.10189016

Cite this

Bhotkar, K., Yu, Y. Y., Adhikari, B. C., & Park, K. C. (2023). Effect of Electrical Aging of Cold Cathode C-Beam on Focal Spot Size and X-Ray Dose. In 36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023 (pp. 233-234). (36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVNC57695.2023.10189016

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abstract = "The purpose of this study was to evaluate the effect of electrical aging on the cold cathode electron beam (C-beam). This experiment is performed by the vertically aligned carbon nanotube in which it is established that the applied bias for efficient electrical aging and defined the bias voltage as the voltage at which joule heating occurred. A long-term stable field electron emission from carbon nanotube arrays can be achieved through an aging process at high emission current. Additionally, x-ray imaging and dose measurement were used to assess the Focal Spot Size (FSS) of the tungsten cross wire used as a standard resolution testing object (EN 12543-5). We found that the aging had no significant effect on the FSS, but the x-ray dose rate enhanced from 0.45 mGy/sec to 1.1 mGy/sec.",

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Bhotkar, K, Yu, YY, Adhikari, BC & Park, KC 2023, Effect of Electrical Aging of Cold Cathode C-Beam on Focal Spot Size and X-Ray Dose. in 36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023. 36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023, Institute of Electrical and Electronics Engineers Inc., pp. 233-234, 36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023, Cambridge, United States, 10/07/23. https://doi.org/10.1109/IVNC57695.2023.10189016

Effect of Electrical Aging of Cold Cathode C-Beam on Focal Spot Size and X-Ray Dose. / Bhotkar, Ketan; Yu, Yi Yin; Adhikari, Bishwa Chandra et al.
36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023. Institute of Electrical and Electronics Engineers Inc., 2023. p. 233-234 (36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Bhotkar K, Yu YY, Adhikari BC, Park KC. Effect of Electrical Aging of Cold Cathode C-Beam on Focal Spot Size and X-Ray Dose. In 36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023. Institute of Electrical and Electronics Engineers Inc. 2023. p. 233-234. (36th IEEE International Vacuum Nanoelectronics Conference, IVNC 2023). doi: 10.1109/IVNC57695.2023.10189016

Effect of Electrical Aging of Cold Cathode C-Beam on Focal Spot Size and X-Ray Dose

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