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Effect of ion doping temperature on electrical properties of APCVD a-Si

  • Kyung Ha Lee
  • , Byeong Yeon Moon
  • , Yoo Chan Chung
  • , Seung Min Lee
  • , Sung Chul Kim
  • , Donggil Kim
  • , Jin Jang

Research output: Contribution to journalConference articlepeer-review

Abstract

We have studied the effect of ion doping on the electrical properties for atmospheric pressure chemical vapor deposition (APCVD) amorphous silicon (a-Si) films. The room temperature conductivities after ion doping at optimum doping temperatures for n- and p-type a-Si films were found to be > 10-2 and >10-4 S/cm, respectively. The unintentional hydrogen incorporation into a-Si during ion doping enhances the quality of ion doped APCVD a-Si as compared to that of plasma enhanced CVD (PECVD) a-Si:H. We obtained the field effect mobility of > 1 cm2/Vs for APCVD a-Si TFT using ion doped n+-layer.

Original languageEnglish
Pages (from-to)35-40
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume345
DOIs
Publication statusPublished - 1994
EventProceedings of the 1994 MRS Spring Meeting - San Francisco, CA, USA
Duration: 5 Apr 19946 Apr 1994

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