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Effect of ion doping temperature on electrical properties of APCVD A-SI

  • Kyung Ha Lee
  • , Byeong Yeon Moon
  • , Yoo Chan Chung
  • , Seung Min Lee
  • , Sung Chul Kim
  • , Donggil Kim
  • , Jin Jang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We have studied the effect of ion doping on the electrical properties for atmospheric pressure chemical vapor deposition (APCVD) amorphous silicon (a-Si) films. The room temperature conductivities after ion doping at optimum doping temperatures for n- and p-type a-Si films were found to be > 10-2 and >10-4S/cm, respectively. The unintentional hydrogen incorporation into a-Si during ion doping enhances the quality of ion doped APCVD a-Si as compared to that of plasma enhanced CVD (PECVD) a-Si:H. We obtained the field effect mobility of > 1 cm2Vs for APCVD a-Si TFT using ion doped n+-layer.

Original languageEnglish
Title of host publicationAmorphous Silicon Technology - 1994
PublisherMaterials Research Society
Pages469-474
Number of pages6
ISBN (Print)1558992367, 9781558992368
DOIs
Publication statusPublished - 1994
Event1994 MRS Spring Meeting - San Francisco, CA, United States
Duration: 4 Apr 19948 Apr 1994

Publication series

NameMaterials Research Society Symposium Proceedings
Volume336
ISSN (Print)0272-9172

Conference

Conference1994 MRS Spring Meeting
Country/TerritoryUnited States
CitySan Francisco, CA
Period4/04/948/04/94

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