Abstract
Effect of oxygen partial-pressure (Po) is investigated in amorphous-InGaZnO thin-film transistors. In addition to improved stability, the threshold-voltage shifts from -0.3 to 0.8 V, while mobility decreases from 20 to 8 cm2/V·s as the Po increases from 2 to 16 seem. Po can therefore be used to control the threshold-voltage.
| Original language | English |
|---|---|
| Title of host publication | Society for Information Display - 18th International Display Workshops 2011, IDW'11 |
| Pages | 599-602 |
| Number of pages | 4 |
| Publication status | Published - 2011 |
| Event | 18th International Display Workshops 2011, IDW 2011 - Nagoya, Japan Duration: 7 Dec 2011 → 9 Dec 2011 |
Publication series
| Name | Proceedings of the International Display Workshops |
|---|---|
| Volume | 1 |
| ISSN (Print) | 1883-2490 |
Conference
| Conference | 18th International Display Workshops 2011, IDW 2011 |
|---|---|
| Country/Territory | Japan |
| City | Nagoya |
| Period | 7/12/11 → 9/12/11 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
-
SDG 3 Good Health and Well-being
Fingerprint
Dive into the research topics of 'Effect of oxygen partial pressure on the performance of a-IGZO TFTs with a self-aligned top-gate coplanar structure'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver