Enhanced multiferroic properties of tetragonally strained epitaxial BiMnO                         3                          thin films grown on single crystal Rh substrates

Hyun Wook Shin; Jong Yeog Son

doi:10.1016/j.solidstatesciences.2019.03.003

Enhanced multiferroic properties of tetragonally strained epitaxial BiMnO ₃ thin films grown on single crystal Rh substrates

Hyun Wook Shin
, Jong Yeog Son

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

Epitaxial BiMnO ₃ (BMO) thin films with tetragonally strained structures were fabricated and their multiferroic properties were investigated in order to improve the leakage current characteristics of the BMO thin films and to secure the excellent multiferroic properties. The x-ray diffraction experiment confirmed that the BMO thin films grown on the Rh substrates had noticeably tetragonally strained structure compared to the BMO thin films on the Nb doped SrTiO ₃ substrates. As a result, the leakage current characteristics of the BMO thin films were improved, and the ferroelectric hysteresis loops were also excellent enough to be used for the nonvolatile memory devices. In addition, it was confirmed that the BMO thin films had a multiferroic property by measuring the ferromagnetic hysteresis loops of the BFM thin films, and it was confirmed that the ferromagnetic properties were improved by the tetragonal strain. Further, the band gaps of the BMO thin films were measured and it was confirmed that the band gap of the strained BFO thin film was increased.

Original language	English
Pages (from-to)	7-9
Number of pages	3
Journal	Solid State Sciences
Volume	91
DOIs	https://doi.org/10.1016/j.solidstatesciences.2019.03.003
Publication status	Published - May 2019

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© 2019 Elsevier Masson SAS

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10.1016/j.solidstatesciences.2019.03.003

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@article{64ac6c017f2b42afa044b433930a7e81,

title = " Enhanced multiferroic properties of tetragonally strained epitaxial BiMnO 3 thin films grown on single crystal Rh substrates ",

abstract = " Epitaxial BiMnO 3 (BMO) thin films with tetragonally strained structures were fabricated and their multiferroic properties were investigated in order to improve the leakage current characteristics of the BMO thin films and to secure the excellent multiferroic properties. The x-ray diffraction experiment confirmed that the BMO thin films grown on the Rh substrates had noticeably tetragonally strained structure compared to the BMO thin films on the Nb doped SrTiO 3 substrates. As a result, the leakage current characteristics of the BMO thin films were improved, and the ferroelectric hysteresis loops were also excellent enough to be used for the nonvolatile memory devices. In addition, it was confirmed that the BMO thin films had a multiferroic property by measuring the ferromagnetic hysteresis loops of the BFM thin films, and it was confirmed that the ferromagnetic properties were improved by the tetragonal strain. Further, the band gaps of the BMO thin films were measured and it was confirmed that the band gap of the strained BFO thin film was increased.",

author = "Shin, \{Hyun Wook\} and Son, \{Jong Yeog\}",

note = "Publisher Copyright: {\textcopyright} 2019 Elsevier Masson SAS",

year = "2019",

month = may,

doi = "10.1016/j.solidstatesciences.2019.03.003",

language = "English",

volume = "91",

pages = "7--9",

journal = "Solid State Sciences",

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Enhanced multiferroic properties of tetragonally strained epitaxial BiMnO ₃ thin films grown on single crystal Rh substrates . / Shin, Hyun Wook; Son, Jong Yeog.
In: Solid State Sciences, Vol. 91, 05.2019, p. 7-9.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Enhanced multiferroic properties of tetragonally strained epitaxial BiMnO 3 thin films grown on single crystal Rh substrates

AU - Shin, Hyun Wook

AU - Son, Jong Yeog

PY - 2019/5

Y1 - 2019/5

N2 - Epitaxial BiMnO 3 (BMO) thin films with tetragonally strained structures were fabricated and their multiferroic properties were investigated in order to improve the leakage current characteristics of the BMO thin films and to secure the excellent multiferroic properties. The x-ray diffraction experiment confirmed that the BMO thin films grown on the Rh substrates had noticeably tetragonally strained structure compared to the BMO thin films on the Nb doped SrTiO 3 substrates. As a result, the leakage current characteristics of the BMO thin films were improved, and the ferroelectric hysteresis loops were also excellent enough to be used for the nonvolatile memory devices. In addition, it was confirmed that the BMO thin films had a multiferroic property by measuring the ferromagnetic hysteresis loops of the BFM thin films, and it was confirmed that the ferromagnetic properties were improved by the tetragonal strain. Further, the band gaps of the BMO thin films were measured and it was confirmed that the band gap of the strained BFO thin film was increased.

AB - Epitaxial BiMnO 3 (BMO) thin films with tetragonally strained structures were fabricated and their multiferroic properties were investigated in order to improve the leakage current characteristics of the BMO thin films and to secure the excellent multiferroic properties. The x-ray diffraction experiment confirmed that the BMO thin films grown on the Rh substrates had noticeably tetragonally strained structure compared to the BMO thin films on the Nb doped SrTiO 3 substrates. As a result, the leakage current characteristics of the BMO thin films were improved, and the ferroelectric hysteresis loops were also excellent enough to be used for the nonvolatile memory devices. In addition, it was confirmed that the BMO thin films had a multiferroic property by measuring the ferromagnetic hysteresis loops of the BFM thin films, and it was confirmed that the ferromagnetic properties were improved by the tetragonal strain. Further, the band gaps of the BMO thin films were measured and it was confirmed that the band gap of the strained BFO thin film was increased.

UR - https://www.scopus.com/pages/publications/85063114532

U2 - 10.1016/j.solidstatesciences.2019.03.003

DO - 10.1016/j.solidstatesciences.2019.03.003

M3 - Article

AN - SCOPUS:85063114532

SN - 1293-2558

VL - 91

SP - 7

EP - 9

JO - Solid State Sciences

JF - Solid State Sciences

ER -

Enhanced multiferroic properties of tetragonally strained epitaxial BiMnO ₃ thin films grown on single crystal Rh substrates

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