Abstract
We fabricated environmentally stable and transparent organic/oxide hybrid transistor on a glass substrate using the conventional photolithography. The obtained device, which was composed of an In-Ga-Zn-O active layer/soluble polyimide (KSPI) organic insulator, showed a mobility of 6.65 cm2/Vs, a subthreshold swing slope of 350 mV/decade, a threshold voltage (V T) of 3.10 V, and an onoff ratio of 3.9 ×9. The transistor also showed good uniformity characteristics and was found to be environmentally stable for 90 days under ambient conditions.
| Original language | English |
|---|---|
| Article number | 5433037 |
| Pages (from-to) | 446-448 |
| Number of pages | 3 |
| Journal | IEEE Electron Device Letters |
| Volume | 31 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - May 2010 |
Bibliographical note
Funding Information:Manuscript received January 10, 2010; revised February 1, 2010. Date of publication March 18, 2010; date of current version April 23, 2010. This work was supported in part by the IT R&D program [2006-S079-05, Smart window with transparent electronic devices] and the 21st century Frontier R&D Program of the Ministry of Knowledge Economy of the Korean government and in part by Project No. SK-0903-02. The review of this letter was arranged by Editor J. K. O. Sin.
Keywords
- Oxide
- Sputtering
- Thin-film transistor (TFT)
- Transparent
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