Experimental study of the x-ray linear dichroism of NiO films grown on Fe(001)

Y. Z. Wu, B. Sinkovic, C. Won, J. Zhu, Y. Zhao, Z. Q. Qiu

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

X-ray linear dichroism (XLD) effects at the Ni L 2 edge of NiO films grown on Fe(001) were studied systematically as a function of NiO thickness (d NiO), temperature, interfacial modulation, and Fe magnetization directions. We found that the Ni XLD signal exhibited an unusual dependence on d NiO. The XLD effect persists above the Néel temperature and exhibits a similar d NiO-dependence as the behavior at room temperature. On the other hand the Ni XLD signal reverses its sign as the Fe magnetization is switched by 90. We propose a possible mechanism such that the Fe magnetostriction induces the NiO uniaxial crystal field to dominate the XLD magnitude in the NiO/Fe(001) system.

Original languageEnglish
Article number134436
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume85
Issue number13
DOIs
Publication statusPublished - 23 Apr 2012

Fingerprint

Dive into the research topics of 'Experimental study of the x-ray linear dichroism of NiO films grown on Fe(001)'. Together they form a unique fingerprint.

Cite this