Abstract
X-ray linear dichroism (XLD) effects at the Ni L 2 edge of NiO films grown on Fe(001) were studied systematically as a function of NiO thickness (d NiO), temperature, interfacial modulation, and Fe magnetization directions. We found that the Ni XLD signal exhibited an unusual dependence on d NiO. The XLD effect persists above the Néel temperature and exhibits a similar d NiO-dependence as the behavior at room temperature. On the other hand the Ni XLD signal reverses its sign as the Fe magnetization is switched by 90. We propose a possible mechanism such that the Fe magnetostriction induces the NiO uniaxial crystal field to dominate the XLD magnitude in the NiO/Fe(001) system.
Original language | English |
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Article number | 134436 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 85 |
Issue number | 13 |
DOIs | |
Publication status | Published - 23 Apr 2012 |