Extrapolation of critical thickness of GaN thin films from lattice constant data using synchrotron X-ray
- Chinkyo Kim
- , I. K. Robinson
- , Jaemin Myoung
- , Kyuhwan Shim
- , Kyekyoon Kim
- , Myung Cheol Yoo
Research output: Contribution to journal › Conference article › peer-review
2
Citations
(Scopus)