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Eye-Width and Eye-Height Estimation Method Based on Artificial Neural Network (ANN) for USB 3.0

  • Daehwan Lho
  • , Junyong Park
  • , Hyunwook Park
  • , Hyungmin Kang
  • , Shinyoung Park
  • , Joungho Kim

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

17 Citations (Scopus)

Abstract

As technology develops, the amount of data used increases exponentially and the operating speed of electronic devices increases accordingly. As the operating speed increases, the transmission speed of data exchanged through the channel also increases. To get an eye-diagram, a time-domain simulation is required, which consumes a lot of time and computer power. However, a channel simulation in frequency-domain is fast and it consumes less computer power. Therefore, using the frequency-domain simulation data is more efficient than the time-domain simulation. This paper proposes an eye-width and eye-height estimation method using an artificial neural network (ANN). The input of the ANN is insertion loss and the outputs of the ANN are eye-width and eye-height. Finally, the performance of the proposed method is verified by transient eye-diagram simulations with arbitrarily-selected channel parameters.

Original languageEnglish
Title of host publicationEPEPS 2018 - IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages209-211
Number of pages3
ISBN (Electronic)9781538693032
DOIs
Publication statusPublished - 13 Nov 2018
Event27th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2018 - San Jose, United States
Duration: 14 Oct 2018 → 17 Oct 2018

Publication series

NameEPEPS 2018 - IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems

Conference

Conference27th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2018
Country/TerritoryUnited States
CitySan Jose
Period14/10/18 → 17/10/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

Keywords

  • Artificial neural network (ANN)
  • Eye-diagram
  • Eye-diagram Estimation method
  • Signal integrity (SI)

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