Focal Spot Size Enhancement by Offset control of Triode e-beam Module for High Resolution X-ray Imaging

Yi Yin Yu, Kyu Chang Park

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Demands on high quality x-ray imaging techniques are required for early detection of abnormal tissues and quality control of mass production in the field of medical and industrial applications.Moreover, smaller focal spot size (FSS) of x-ray sources have been developed for many decades but still their structure and operational scheme are complicated. To optimize electron beam trajectory, at least two types of focusing electrodes are needed. We demonstrate under 0.5 mm FSS of cold cathode x-ray source triode type e-beam module with vertically aligned carbon nanotubes (VA-CNTs) without any additional focusing electrodes. In addition, gate hole offset effects were investigated to FSS.The authors anticipate that our simple but sophisticated gate structure will be beneficial for high quality x-ray imaging and cost effective in terms of massive production of cold cathode x-ray generators.

Original languageEnglish
Title of host publication2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021
EditorsStephen Purcell, Jean-Paul Mazellier
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665425896
DOIs
Publication statusPublished - 2021
Event34th International Vacuum Nanoelectronics Conference, IVNC 2021 - Virtual, Lyon, France
Duration: 5 Jul 20219 Jul 2021

Publication series

Name2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021

Conference

Conference34th International Vacuum Nanoelectronics Conference, IVNC 2021
Country/TerritoryFrance
CityVirtual, Lyon
Period5/07/219/07/21

Bibliographical note

Publisher Copyright:
© 2021 IEEE.

Fingerprint

Dive into the research topics of 'Focal Spot Size Enhancement by Offset control of Triode e-beam Module for High Resolution X-ray Imaging'. Together they form a unique fingerprint.

Cite this