Growth of polycrystalline silicon films at low temperature by remote plasma CVD

Sung Chul Kim, Kyu Chang Pak, Sung Ki Kim, Jung Mok Jun, Jin Jang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Abstract

We studied the growth of polycrystalline silicon by using remote plasma chemical vapour deposition technique. The effects of RF power and the substrate temperature on the structural properties have been investigated. With increasing the RF power, the crystalline volume fraction and the grain size increase up to 100 W, but decrease for the further increase in power level. We obtained the poly-Si with the crystalline volume fraction of about 74 at.% at the substrate temperature of 330 °C.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium Proceedings
PublisherPubl by Materials Research Society
Pages635-640
Number of pages6
ISBN (Print)1558991786
Publication statusPublished - 1993
EventProceedings of the Second Symposium on Dynamics in Small Confining Systems - Boston, MA, USA
Duration: 30 Nov 19924 Dec 1992

Publication series

NameMaterials Research Society Symposium Proceedings
Volume283
ISSN (Print)0272-9172

Conference

ConferenceProceedings of the Second Symposium on Dynamics in Small Confining Systems
CityBoston, MA, USA
Period30/11/924/12/92

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