Heteroepitaxial growth of MgO thin films on Al2O 3(0001) by metalorganic chemical vapor deposition

Won Park, Dong Hyuk Kim, Y. I. Gyu-Chul, Chinkyo Kim

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

MgO thin films were epitaxially grown on Al2O3(0001) substrates using metalorganic chemical vapor deposition. For film growth, bis-cyclopentadienyl-Mg and oxygen were employed as reactants. X-ray diffraction (XRD) θ-2θ scan and θ-rocking curve data showed a preferred film orientation of [111] direction along Al2O3[0001]. The XRD rocking curve of films grown at 600°C showed a full width at half maximum as narrow as 0.45°, indicating good crystallinity. The pole figures of MgO thin films, which show clearly six poles with 60° of rotational symmetry, imply that the MgO films were epitaxially grown with either 60° twins or inversion domains. Based on the pole figure and azimuthal scan measurements, the epitaxial relationship of MgO(111)//Al2O 3(0001) and MgO[110]//Al2O3[1010] was determined. More importantly, the vertical alignment and surface morphology of the thin films were significantly improved by doping Zn during MgO film growth.

Original languageEnglish
Pages (from-to)6919-6921
Number of pages3
JournalJapanese Journal of Applied Physics
Volume41
Issue number11 B
DOIs
Publication statusPublished - Nov 2002

Keywords

  • Alo(0001) substrates
  • Epitaxial growth
  • Magnesium oxide (mgo)
  • Metalorganic chemical vapor deposition (mocvd)

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