Abstract
We propose a lens assessment method based on incoherent holography, offering a novel alternative to conventional optical testing methods that rely on coherent illumination and interferometry. The traditional approach involves the complicated optical configurations and it is hard to accurately model the actual user experience. In contrast, our proposed incoherent holographic system, utilizing self-interference with a geometric phase lens, enables the acquisition of the complex hologram of incoherent illumination in a single exposure. By reconstructing the hologram captured from structured light patterns, we can calculate the wavefront aberration and displacement, providing a comprehensive lens assessment solution.
Original language | English |
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Title of host publication | Optical Measurement Systems for Industrial Inspection XIII |
Editors | Peter Lehmann |
Publisher | SPIE |
ISBN (Electronic) | 9781510664456 |
DOIs | |
Publication status | Published - 2023 |
Event | Optical Measurement Systems for Industrial Inspection XIII 2023 - Munich, Germany Duration: 26 Jun 2023 → 29 Jun 2023 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 12618 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Conference
Conference | Optical Measurement Systems for Industrial Inspection XIII 2023 |
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Country/Territory | Germany |
City | Munich |
Period | 26/06/23 → 29/06/23 |
Bibliographical note
Publisher Copyright:© 2023 SPIE.
Keywords
- Optical testing
- self-interference
- structured light