High NA lens assessment using self-interference incoherent digital holography

Youngrok Kim, Hyunsik Sung, Wonseok Son, Sung Wook Min

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We propose a lens assessment method based on incoherent holography, offering a novel alternative to conventional optical testing methods that rely on coherent illumination and interferometry. The traditional approach involves the complicated optical configurations and it is hard to accurately model the actual user experience. In contrast, our proposed incoherent holographic system, utilizing self-interference with a geometric phase lens, enables the acquisition of the complex hologram of incoherent illumination in a single exposure. By reconstructing the hologram captured from structured light patterns, we can calculate the wavefront aberration and displacement, providing a comprehensive lens assessment solution.

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection XIII
EditorsPeter Lehmann
PublisherSPIE
ISBN (Electronic)9781510664456
DOIs
Publication statusPublished - 2023
EventOptical Measurement Systems for Industrial Inspection XIII 2023 - Munich, Germany
Duration: 26 Jun 202329 Jun 2023

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12618
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Measurement Systems for Industrial Inspection XIII 2023
Country/TerritoryGermany
CityMunich
Period26/06/2329/06/23

Bibliographical note

Publisher Copyright:
© 2023 SPIE.

Keywords

  • Optical testing
  • self-interference
  • structured light

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