Highly reliable and transparent Al doped Ag cathode fabricated using thermal evaporation for transparent OLED applications

Min Geun Song, Kwan Soo Kim, Hye In Yang, Seong Keun Kim, Jae Hyun Kim, Chang Wook Han, Hyun Chul Choi, Ramchandra Pode, Jang Hyuk Kwon

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

Abstract

Here, we report a highly reliable and transparent cathode (TC) for transparent organic light emitting diode (TOLED) applications. The cathode layer is fabricated by co-deposition of silver (Ag) and aluminum (Al) metals using thermal evaporation. The atomic percentages of Al and Ag are fixed at 96 at% and 4 at%, respectively. TC shows transmittance at 520 nm (T@520nm) of 83.5% and sheet resistance as low as 7.0 Ω/□. Almost no specific agglomeration of Ag:Al (4%, 14 nm) is noticed by the thermal annealing of fabricated cathode at 85 °C, 240 h. The fabricated TOLED with this Ag:Al (4%, 14 nm) cathode shows an excellent electron injection property with a T@520nm of 83.5%, and achieved current efficiencies of 36 and 18 cd/A from bottom and top sides emissions, respectively. It is argued that the Al-doped Ag film could become an effective, feasible alternative to the existing transparent conducting electrode for TOLED applications.

Original languageEnglish
Article number105418
JournalOrganic Electronics
Volume76
DOIs
Publication statusPublished - Jan 2020

Keywords

  • Ag:Al cathode
  • SEM and XPS measurements
  • Transparent OLED
  • transparent cathode

Fingerprint

Dive into the research topics of 'Highly reliable and transparent Al doped Ag cathode fabricated using thermal evaporation for transparent OLED applications'. Together they form a unique fingerprint.

Cite this