Improvement of density of states in the CLC poly-Si using microlens array

N. K. Son; A. R. Kim; Y. D. Son; J. Jang

Improvement of density of states in the CLC poly-Si using microlens array

N. K. Son
, A. R. Kim
, Y. D. Son
, J. Jang

Research output: Contribution to conference › Paper › peer-review

Abstract

High performance of CLC poly-Si thin film transistor used in AMLCD and AMOLED applications, directly depends on the density of states (DOS) in the channel material. In this paper, we investigated the DOS of CLC poly-Si TFTs using microlens array and conventional CLC method. The CLC poly-Si TFTs using microlens array has lower DOS than conventional CLC method. Also, we have compared with CLC poly-Si TFTs and ELA poly-Si TFTs.

Original language	English
Pages	2007-2008
Number of pages	2
Publication status	Published - 2007
Event	14th International Display Workshops, IDW '07 - Sapporo, Japan Duration: 5 Dec 2007 → 5 Dec 2007

Conference

Conference	14th International Display Workshops, IDW '07
Country/Territory	Japan
City	Sapporo
Period	5/12/07 → 5/12/07

Cite this

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title = "Improvement of density of states in the CLC poly-Si using microlens array",

abstract = "High performance of CLC poly-Si thin film transistor used in AMLCD and AMOLED applications, directly depends on the density of states (DOS) in the channel material. In this paper, we investigated the DOS of CLC poly-Si TFTs using microlens array and conventional CLC method. The CLC poly-Si TFTs using microlens array has lower DOS than conventional CLC method. Also, we have compared with CLC poly-Si TFTs and ELA poly-Si TFTs.",

author = "Son, \{N. K.\} and Kim, \{A. R.\} and Son, \{Y. D.\} and J. Jang",

year = "2007",

language = "English",

pages = "2007--2008",

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TY - CONF

T1 - Improvement of density of states in the CLC poly-Si using microlens array

AU - Son, N. K.

AU - Kim, A. R.

AU - Son, Y. D.

AU - Jang, J.

PY - 2007

Y1 - 2007

N2 - High performance of CLC poly-Si thin film transistor used in AMLCD and AMOLED applications, directly depends on the density of states (DOS) in the channel material. In this paper, we investigated the DOS of CLC poly-Si TFTs using microlens array and conventional CLC method. The CLC poly-Si TFTs using microlens array has lower DOS than conventional CLC method. Also, we have compared with CLC poly-Si TFTs and ELA poly-Si TFTs.

AB - High performance of CLC poly-Si thin film transistor used in AMLCD and AMOLED applications, directly depends on the density of states (DOS) in the channel material. In this paper, we investigated the DOS of CLC poly-Si TFTs using microlens array and conventional CLC method. The CLC poly-Si TFTs using microlens array has lower DOS than conventional CLC method. Also, we have compared with CLC poly-Si TFTs and ELA poly-Si TFTs.

UR - https://www.scopus.com/pages/publications/43349101012

M3 - Paper

AN - SCOPUS:43349101012

SP - 2007

EP - 2008

T2 - 14th International Display Workshops, IDW '07

Y2 - 5 December 2007 through 5 December 2007

ER -

Improvement of density of states in the CLC poly-Si using microlens array

Abstract

Conference

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