Abstract
An integration of CNT-FEAs grown with RAP process with MOSFET on silicon substrate has been proposed. The structure is very useful for active control of the emission current of CNT-FEAs. And shadow mask was adapted to simplify process. The feasibility of the integration was studied.
Original language | English |
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Pages | 1481-1484 |
Number of pages | 4 |
Publication status | Published - 2009 |
Event | 16th International Display Workshops, IDW '09 - Miyazaki, Japan Duration: 9 Dec 2009 → 11 Dec 2009 |
Conference
Conference | 16th International Display Workshops, IDW '09 |
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Country/Territory | Japan |
City | Miyazaki |
Period | 9/12/09 → 11/12/09 |