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Interdiffusion and structural change in an InGaAs dots-in-a-well structure by rapid thermal annealing

  • Young Min Park
  • , Young Ju Park
  • , Kwang Moo Kim
  • , Jin Dong Song
  • , Jung I.I. Lee
  • , Keon Ho Yoo
  • , Hyung Seok Kim
  • , Chan Gyung Park

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

Post-growth rapid thermal annealing (RTA) has been used to investigate an interdiffusion and the structural change in an InGaAs dots-in-a-well (DWELL) structure grown by molecular beam epitaxy using an alternately supplying InAs and GaAs sources. In the case of the as-grown sample, which has a metastable quantum structure due to an intentional deficit of source materials, it is found that an InGaAs quantum well (QW) coexists with the premature quantum dots (QDs), and an intermediate layer exists between the QW and the QDs. Through the RTA process at 600 and 800°C for 30 s, metastable structure changes into a normal DWELL structure composed of QDs and QW as a result of the intermixing of premature QDs and the intermediate layer.

Original languageEnglish
Pages (from-to)5496-5499
Number of pages4
JournalJournal of Applied Physics
Volume96
Issue number10
DOIs
Publication statusPublished - 15 Nov 2004

Bibliographical note

Funding Information:
This work was supported by the Nanostructure Technology Project (Contract No. M1-0221-00-0005), by the basic research program of the KOSEF (Grant No. R01-2000-00027), and by the Nano R&D program of MOST.

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