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Interrelation between ferroelectric properties and defects based on low-frequency noise analysis of HZO ferroelectric capacitor
Seunghee Jin, Juye Jeon, Min Jung Kim, Kiseok Heo, Jeong Hun Kim, Jong Pil Im, Sung Min Yoon, Seung Eon Moon, Jiyong Woo, Jae Woo Lee
Research output: Contribution to journal › Article › peer-review
4
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(Scopus)