TY - GEN
T1 - Meso-moiré fringe observation of nano-particle structures by electron Moiré method
AU - Kishimoto, Satoshi
AU - Yamauchi, Yusuke
N1 - Copyright:
Copyright 2011 Elsevier B.V., All rights reserved.
PY - 2010
Y1 - 2010
N2 - A new method to measure the spacing and direction in the ordered assembled nanoparticles by using the electron Moiré fringes has been developed. In this method an assembled nanoparticle array can be consider as a model grid. When the electron beam was irradiated on the top of the nanoparticles, the amount of secondary electrons per primary electron is quite large. On the other hand, when the electron beam was irradiated on the valley among the neighboring nanoparticles, the amount of secondary electrons per primary electron is smaller. The difference of the generated secondary electrons per a primary electron fabricate periodical bright and dark pattern, which is the electron mesomoiré fringes. Using this method, the spacing and orientation of the assembled nanoparticle array was measured.
AB - A new method to measure the spacing and direction in the ordered assembled nanoparticles by using the electron Moiré fringes has been developed. In this method an assembled nanoparticle array can be consider as a model grid. When the electron beam was irradiated on the top of the nanoparticles, the amount of secondary electrons per primary electron is quite large. On the other hand, when the electron beam was irradiated on the valley among the neighboring nanoparticles, the amount of secondary electrons per primary electron is smaller. The difference of the generated secondary electrons per a primary electron fabricate periodical bright and dark pattern, which is the electron mesomoiré fringes. Using this method, the spacing and orientation of the assembled nanoparticle array was measured.
KW - Assembled nanoparticle array
KW - Electron Moiré method
KW - Silica nanoparticle
KW - Spacing measurement
UR - http://www.scopus.com/inward/record.url?scp=79958096440&partnerID=8YFLogxK
U2 - 10.1117/12.851593
DO - 10.1117/12.851593
M3 - Conference contribution
AN - SCOPUS:79958096440
SN - 9780819479129
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Fourth International Conference on Experimental Mechanics
T2 - 4th International Conference on Experimental Mechanics
Y2 - 18 November 2009 through 20 November 2009
ER -