Microstructural analysis of void formation due to a NH4Cl layer for self-separation of GaN thick films
- Hyun Jae Lee
- , Jun Seok Ha
- , Takafumi Yao
- , Chinkyo Kim
- , Soon Ku Hong
- , Jiho Chang
- , Jae Wook Lee
- , Jeong Yong Lee
Research output: Contribution to journal › Article › peer-review
7
Citations
(Scopus)