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Noise analysis of MREIT at 3T and 11T field strength
R. J. Sadleir, S. C. Grant, S. U. Zhang, S. H. Oh, B. I. Lee, H. C. Pyo, C. J. Park, E. J. Woo, S. Y. Lee, J. K. Seo, O. Kwon
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2
Citations
(Scopus)