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Optical alignment of a linear astigmatism-free imaging system using a Shack-Hartmann wavefront sensor and merit function regression method

  • Hojae Ahn
  • , Changgon Kim
  • , Dohoon Kim
  • , Soojong Pak
  • , Sung Joon Park
  • , Geon Hee Kim
  • , Goo Hwan Shin
  • , Dae Hee Lee
  • , In Young Hwang
  • , Kyung Su Na

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We have designed and fabricated a telescope consisting of three freeform surfaces that satisfy the linear astigmatism-free condition for spaceborne remote sensing. After a coarse optical alignment using a coordinate measuring machine, we measured the wavefront at the center field using a Shack-Hartmann sensor for fine-tuning. The measured wavefront error (WFE), decomposed into Zernike polynomials, was used to define a merit function. The nominal design was adjusted to reproduce the measured WFE by changing the values of misalignments. Based on the simulation results, the position and tilt of the mirrors were fine-tuned using shim rings and shim tapes. After compensation, the root-mean-square WFE was reduced from 123 nm to 86 nm. The measured full width at half maximum of the point spread function also decreased from 16 µm to 14 µm.

Original languageEnglish
Title of host publicationOptical System Alignment, Tolerancing, and Verification XVI
EditorsRobert M. Malone, Kate Medicus, Jose Sasian
PublisherSPIE
ISBN (Electronic)9781510691124
DOIs
Publication statusPublished - 17 Sept 2025
Event16th Optical System Alignment, Tolerancing, and Verification - San Diego, United States
Duration: 3 Aug 20253 Aug 2025

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13602
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference16th Optical System Alignment, Tolerancing, and Verification
Country/TerritoryUnited States
CitySan Diego
Period3/08/253/08/25

Bibliographical note

Publisher Copyright:
© 2025 Published by SPIE.

Keywords

  • Linear astigmatism-free
  • Merit function regression
  • Off-axis reflector
  • Optical alignment
  • Shack-Hartmann sensor
  • Wavefront

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