Optical properties of bismuth niobate thin films studied by spectroscopic ellipsometry

Y. J. Kang, T. H. Ghong, Y. W. Jung, J. S. Byun, S. Kim, Y. D. Kim, T. G. Seong, K. H. Cho, S. Nahm

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

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