Abstract
This study successfully built a carbon nanotube (VACNT) cold cathode (C-beam) as a potential electron source for high-resolution scanning electron microscopes. The C-beam achieved a stable emission current with high transmission and a narrow beam divergence angle. These findings suggest VACNTC-beams hold promise for next-generation microscopy techniques.
| Original language | English |
|---|---|
| Title of host publication | 2024 37th International Vacuum Nanoelectronics Conference, IVNC 2024 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9798350379754 |
| DOIs | |
| Publication status | Published - 2024 |
| Event | 37th International Vacuum Nanoelectronics Conference, IVNC 2024 - Brno, Czech Republic Duration: 15 Jul 2024 → 19 Jul 2024 |
Publication series
| Name | 2024 37th International Vacuum Nanoelectronics Conference, IVNC 2024 |
|---|
Conference
| Conference | 37th International Vacuum Nanoelectronics Conference, IVNC 2024 |
|---|---|
| Country/Territory | Czech Republic |
| City | Brno |
| Period | 15/07/24 → 19/07/24 |
Bibliographical note
Publisher Copyright:© 2024 IEEE.
Keywords
- C-beam
- Carbon nanotube
- DC-PECVD
- Divergence angle
- Phosphor screen imaging
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