Photo-Stable Transparent Nonvolatile Memory Thin-Film Transistors Using In-Ga-Zn-O Channel and ZnO Charge-Trap Layers

S. J. Kim, W. H. Lee, C. W. Byun, C. S. Hwang, S. M. Yoon

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

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