@inproceedings{771253e6517c4d91ba874c653471042a,
title = "Photon-enhanced bias instability of InGaZnO TFT with dual gate structure",
abstract = "We have fabricated dual gate IGZO TFT to investigate the photo-enhanced bias instability of IGZO TFT. Contrary to the single gate device in a bottom gate and top gate structure, the dual mode device showed less Vth shift under the visible white light illumination with negative bias stress. We attributed this less negative Vth shift to the reduced hole or positive charged species trapping at the interface due to the reduced effective gate field in the dual gate oxide TFT.",
keywords = "Dual gate, Oxide TFT, Photo-enhanced bias instability",
author = "Minki Ryu and Park, \{Sang Hee Ko\} and Hwang, \{Chi Sun\} and Yoon, \{Sung Min\} and Chunwon Byun and Kim, \{Byeong Hoon\} and Kwon, \{Oh Sang\} and Park, \{Eun Suk\} and Shinhyuk Yang and Himchan Oh and Kyounghwan Kim and Cho, \{Kyoung Ik\}",
note = "Copyright: Copyright 2011 Elsevier B.V., All rights reserved.; 10th International Meeting on Information Display and International Display Manufacturing Conference and Asia Display 2010, IMID/IDMC/ASIA Display 2010 ; Conference date: 11-10-2010 Through 15-10-2010",
year = "2010",
language = "English",
isbn = "9781617827020",
series = "Proceedings of International Meeting on Information Display",
pages = "226--227",
booktitle = "10th International Meeting on Information Display and International Display Manufacturing Conference and Asia Display 2010, IMID/IDMC/ASIA Display 2010",
}