Abstract
PbZrxTi1-zO3(PZT)/La1-xSr xCoO3(LSCO) heterostructures were grown on MgO(100) substrates using the sol - gel technique and their structural and electrical properties were investigated. X-ray diffraction analysis showed that the PZT/LSCO film was polycrystalline with partial preferred (001/100) orientations. Fairly good ferroelectric properties of PZT were obtained when the PZT films were deposited on a well-crystallized LSCO film and were annealed at 700°C for 1 min. A typical value of the remnant polarization was 28 μC/cm2. It was also found that a longer annealing time enhanced the interdiffusion of constituent elements between LSCO and PZT. It is concluded from these results that in sol - gel processing, prevention of interdiffusion and crystallinity of the LSCO electrode film are two important factors for obtaining the desirable structural and electrical properties in this system.
| Original language | English |
|---|---|
| Pages (from-to) | 447-452 |
| Number of pages | 6 |
| Journal | Applied Surface Science |
| Volume | 117-118 |
| DOIs | |
| Publication status | Published - 2 Jun 1997 |
Bibliographical note
Funding Information:This work was partly supportedb y Grant-in-Aid for COE Researcho n Ultra-paralleOl ptoelectronics (No. 07CE2003)a ndG rant-in-Aidf or ScientificR e-searcho n Priority Areas (No. 07248105f)r om the Ministry of EducationS, cience,S portsa nd Culture.
Keywords
- Conductive oxide
- Ferroelectric
- PZT/LSCO
- Perovskite heterostructure
- Sol-gel method
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