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Preparation of PbZrxTi1-xO3/La1-xSr xCoO3 heterostructures using the sol - gel method and their electrical properties

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Abstract

PbZrxTi1-zO3(PZT)/La1-xSr xCoO3(LSCO) heterostructures were grown on MgO(100) substrates using the sol - gel technique and their structural and electrical properties were investigated. X-ray diffraction analysis showed that the PZT/LSCO film was polycrystalline with partial preferred (001/100) orientations. Fairly good ferroelectric properties of PZT were obtained when the PZT films were deposited on a well-crystallized LSCO film and were annealed at 700°C for 1 min. A typical value of the remnant polarization was 28 μC/cm2. It was also found that a longer annealing time enhanced the interdiffusion of constituent elements between LSCO and PZT. It is concluded from these results that in sol - gel processing, prevention of interdiffusion and crystallinity of the LSCO electrode film are two important factors for obtaining the desirable structural and electrical properties in this system.

Original languageEnglish
Pages (from-to)447-452
Number of pages6
JournalApplied Surface Science
Volume117-118
DOIs
Publication statusPublished - 2 Jun 1997

Bibliographical note

Funding Information:
This work was partly supportedb y Grant-in-Aid for COE Researcho n Ultra-paralleOl ptoelectronics (No. 07CE2003)a ndG rant-in-Aidf or ScientificR e-searcho n Priority Areas (No. 07248105f)r om the Ministry of EducationS, cience,S portsa nd Culture.

Keywords

  • Conductive oxide
  • Ferroelectric
  • PZT/LSCO
  • Perovskite heterostructure
  • Sol-gel method

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