Skip to main navigation Skip to search Skip to main content

Quantum-Dots Photosensor with Wide Bandgap P-Type and N-Type Oxide Semiconductors for High Detectivity and Responsivity

  • Yoseob Kim
  • , Jeonggi Kim
  • , Hyo Min Kim
  • , Jin Jang

Research output: Contribution to journalArticlepeer-review

39 Citations (Scopus)

Abstract

The photodiode is a promising architecture for photodetection because of its fast response and high external quantum efficiency (EQE). The photodiode requires high detectivity, responsivity, and low dark current for various applications. Here, a new structure of quantum-dots (QD) photodiode is reported for ultraviolet (UV), blue, green, and red light sensing using a red QD layer between p-type and n-type metal-oxide semiconductors. CdZnSeS/ZnS QD is used for photoabsorption with p-type Cu2SnS3–Ga2O3 and n-type Li doped ZnO (LZO) for carrier collection. The QD photodiode has a low dark current density of 2.08 nA cm−2 at −1 V leading to high rectification ratio of ≈105. The QD photodiode shows superior properties with responsivity of 0.258 A W−1 and detectivity of 1.00 × 1013 Jones at −1 V under green illumination. The rise and fall times of QD photodiode are 2.1 and 2.6 ms, respectively. The QD photodiode on a flexible polyimide (PI) substrate is also demonstrated, exhibiting stable characteristics under bending test of 20 000 cycles at a bending radius of 0.32 mm.

Original languageEnglish
Article number1900857
JournalAdvanced Materials Technologies
Volume5
Issue number1
DOIs
Publication statusPublished - 1 Jan 2020

Bibliographical note

Publisher Copyright:
© 2019 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

Keywords

  • high detectivity
  • low dark current
  • photosensors
  • quantum-dots photodiodes
  • wide bandgap oxides

Fingerprint

Dive into the research topics of 'Quantum-Dots Photosensor with Wide Bandgap P-Type and N-Type Oxide Semiconductors for High Detectivity and Responsivity'. Together they form a unique fingerprint.

Cite this